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Hprobe - Supplier of Wafer Level Parametric and functional testers

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*All information covered under NDAs and/or confidentiality agreements is excluded from publication.

Note: Dates are publication dates only and may or may not coincide with the event/data published.

Tier -1 EU research institute with commercial connections is evaluating 

Hprobe's 3D automated tester LINX platform for both sensor and NVM applications. 

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Hprobe closes sale of IBEX wafer level magnetic tester to tier-1 North American research group with global affiliations.

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Revolutionizing Wafer Testing to Bring New Technologies to Market

Semiconductor Digest Article.

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Hprobe develops SOT-MRAM testing protocols and hastens STT-MRAM testing for ramp-up into volume manufacturing.

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MRAM testing for High Volume Manufacturing

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MRAM testing for High Volume Manufacturing (Chipscale Article)

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Hprobe joins with IMEC for SOT-MRAM tester development

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Hprobe partners: CNRS, SATT Linksium, Spintec.

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