Speed-up your magnetic test!

Grenoble, France based Hprobe designs & builds automated wafer level magnetic test solutions for MRAM, HDD, magnetic sensors & inductors. Customers can upgrade existing probe stations e.g. Accretech, TEL, etc. or choose a fully integrated stand-alone turn-key tester. 

Hprobe utilizes proprietary magnet designs (w/o cryogens) and software package to extract a broad range of 2D and 3D test data from both in-plane and perpendicular MRAM (Spin-Torque/STT/OST/SOT/TAS), HDD, magnetic sensor & inductor devices on 100/200/300mm wafers with in-plane fields up to 3,500oe and perpendicular fields from 5000 to 10,000oe. 

North American Nanotech, Inc. 

12701 Welcome Lane 

Burnsville, MN 55337

www.northamericananotech.com

CONTACT US

P. 612-819-5149

E. northamericananotech@icloud.com

Skype @ dmmontag612

© North American Nanotech, Inc. All Rights Reserved.

Design by Jessica Grajeda Designs