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Speed-up your magnetic test!

Grenoble, France based Hprobe designs & builds automated wafer level magnetic test solutions for MRAM, HDD, magnetic sensors & inductors. Customers can upgrade existing probe stations e.g. Accretech, TEL, etc. or choose a fully integrated stand-alone turn-key tester. 
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For MRAM applications the IBEX P/F utilizes proprietary magnet designs (w/o cryogens) and software package to extract a broad range of 2D and 3D test data from both in-plane and perpendicular MRAM including SpinTorque, STT, OST, SOT and TAS on 100/200/300mm wafers with in-plane fields up to 3,500oe and perpendicular fields from 5000 to 10,000oe. 

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For magnetic sensor applications the LINX-1 utilizes proprietary magnet designs (w/o cryogens) and software package to extract a broad range of 2D and 3D test data from magnetic sensors 100/200/300mm wafers with in-plane fields up to 3,500oe and perpendicular fields from 5000 to 10,000oe.