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Speed-up your magnetic test!

Grenoble, France based Hprobe designs & builds both manual & automated wafer level magnetic test solutions for MRAM, HDD and magnetic sensors. Customers can upgrade existing probe stations e.g. Accretech, TEL, etc. or choose a fully integrated turn-key tester. 
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For MRAM applications the IBEX P/F utilizes proprietary magnet designs (w/o cryogens) and software package to extract a broad range of 2D and 3D test data from both in-plane and perpendicular MRAM including SpinTorque, STT, OST, SOT and TAS on 100/200/300mm wafers with in-plane fields up to 3,500oe and perpendicular fields from 5000 to 10,000oe.The field generation is driven by high performance instrumentation to achieve stable static or high sweep rate variable fields. The instrumentation includes brands such as Keysight, Tektronix and NI, and are integrated using Hprobe’s proprietary building blocks.

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For magnetic sensor applications including Hall, AMR, GMR and TMR sensors the LINX-1 utilizes a proprietary magnet design (w/o cryogens) and software package to extract a broad range of 2D and 3D test data from magnetic sensor with in-plane fields up to 3,500oe and perpendicular fields from 5000 to 10,000oe.The field generation is driven by high performance instrumentation to achieve stable static or high sweep rate variable fields. The instrumentation includes brands such as Keysight, Tektronix and NI, and are integrated using Hprobe’s proprietary building blocks.