November 12 - Albany, NY and Grenoble, France – NY CREATES and Hprobe today announced a strategic collaboration aimed at advancing testing capabilities for next-generation semiconductor memory technologies. This joint development project will focus on the co-development of advanced testing equipment at the 300mm wafer scale, the platform upon which computer chips are built. For more information contact:
NY CREATES: Steve Ference | sference2@ny-creates.org | +1 (518) 424-6029
Hprobe: Camille Dufour | camille.PRConsulting@gmail.com | +33 (0) 6 79 49 51 43
Commentaires