Test & Measurement

The following is a partial list of common search terms...........

Test & Measurement

  • 2D 

  • 3D

  • AFM

  • Array level test

  • ATE

  • Auger

  • Backscatter

  • Breakdown voltage

  • CIPT

  • Current pulses (generator)

  • Curve trace (IV family of curves)

  • DC probes

  • Device characterizationj

  • Device level test

  • Die leve test

  • Diffraction

  • EDS

  • EELS

  • Electrical Verification

  • Electron

  • Elipsometer

  • Endurance

  • ESD 

  • Fermi wavelength

  • Field angle dependence

  • Field projection

  • Focused ion beam

  • Functional test

  • Reflection High Energy Electron Diffraction 

  • Hysterisis loops

  • I/V curve

  • In-plane field

  • Interferometer

  • Ion

  • Magnetic coupling

  • Magnetic head

  • Magnetic test

  • Magnetoresistance curves

  • Magnetic resonances

  • Magneto-resistnace 

  • Magneto-striction

  • Manual wafer load

  • MFM

  • Microwave-frequency

  • MOKE

  • Optical microscope

  • Out of plane field

  • Package level test

  • Parametric test

  • Perpendicular field

  • Planar fiield

  • Probe card

  • Prober

  • Prober staton

  • Probes

  • Product validation

  • Property Mapping

  • Pulse Diagram

  • Pulse width

  • Pulse width dependence

  • Quasistatic Diagrams

  • Refractive index

  • Resistance distribution

  • RF characterization

  • RF probes

  • Secondary electron

  • Section

  • SEM

  • SIMS

  • Spectroscopy

  • SQUID

  • Sweep speed 

  • Switching Phase Diagram

  • Switching probability

  • Switching pulse currents

  • TEM

  • Temperature dependence

  • Thickness monitor

  • Time Domain Reflectometry (TDR)

  • Torque

  • Transmission Line Pulse (TLP)

  • Variable / Rotating in-plane field with fixed perpendicular field

  • Variable 3D magnetic field

  • Variable rotating in-plane field

  • Variable sweep rate

  • Variable uniaxial in plane magnetic field only

  • Variable uniaxial in-plane magnetic field with fixed perpendicular field

  • Variable uniaxial perpendicular magnetic field only

  • Variable uniaxial perpendicular magnetic field with fixed in-plane field

  • Voltage pulses

  • Voltage stress

  • VSM

  • Wafer cooling/heating

  • wafer level magnetic test

  • Wafer level test

  • WDS

  • XPS

  • XRD

  • X-Section

  • XPS

  • WDS

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North Amiercan Nanotech, Inc.                                           Contact Us:

12701 Welcome Lane                                                               P. 612-819-5149

Burnsville, MN 55337                                                              E. northamericananotech@icloud.com

www.northamericananotech.com                                      Skype. dmmontag612