Hprobe designs & builds wafer level magnetic test solutions for MRAM, HDD, magnetic sensors & inductors. Customers can upgrade existing probe stations e.g. Accretech, TEL, etc. or choose a fully integrated stand-alone turn-key tester.  

Hprobe utilizes a proprietary magnet design and software package to extract a broad range of 2D and 3D test data from both in-plane and perpendicular MRAM (Spin-Torque/STT/OST/SOT/TAS), HDD (TFH), magnetic sensor and inductor devices on 100/200/300mm wafers with fields up to 5000oe. 

North American Nanotech, Inc. 

12701 Welcome Lane 

Burnsville, MN 55337



P. 612-819-5149

E. northamericananotech@icloud.com

Skype @ dmmontag612

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